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[IEEE Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (29-31 Aug. 2006)] Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Testing a Datawarehouse - An Industrial Challenge

[IEEE Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Windsor, UK (29-31 Aug. 2006)] Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06) - Testing a Datawarehouse - An Industrial Challenge

Sneed, H.M.
  • 作者Sneed, H.M.
  • 文件大小187.82KB
  • 发表时间2006
  • DOI10.1109/taic-part.2006.27
  • 页码203-210
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