[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Application of EDS Technique for OSP Film Thickness Measurement
- 作者Prong, K.; Sirarat, K.
- 文件大小3302.73KB
- 发表时间2006
- DOI10.1109/IPFA.2006.251030
- 页码200-204
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