Implications of the Contact Radius to Line Step (CRLS) Ratio in AFM for Nanotribology Measurements
Helt, James M.; Batteas, James D.
- 期刊名称Langmuir
- 作者Helt, James M.; Batteas, James D.
- 卷第22卷
- 期第14期
- 印刷ISSN0743-7463
- 电子ISSN1520-5827
- 文件大小1608.04KB
- 发表时间2006-07
- DOI10.1021/la053288k
- 页码6130-6141