[IEEE 2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA (2006.02.6-2006.02.9)] 2006 IEEE International Solid State Circuits Conference - Digest of Technical Papers - High-Speed Digital Double Sampling with Analog CDS on Column Parallel ADC Architecture for Low-Noise Active Pixel Sensor
Nitta, Y.; Muramatsu, Y.; Amano, K.; Toyama, T.; Yamamoto, J.; Mishina, K.; Suzuki, A.; Taura, T.; Kato, A.; Kikuchi, M.; Yasui, Y.; Nomura, H.; Fukushima, N.
- 作者Nitta, Y.; Muramatsu, Y.; Amano, K.; Toyama, T.; Yamamoto, J.; Mishina, K.; Suzuki, A.; Taura, T.; Kato, A.; Kikuchi, M.; Yasui, Y.; Nomura, H.; Fukushima, N.
- 文件大小1956.34KB
- 发表时间2006
- DOI10.1109/isscc.2006.1696261
- 页码2024-2031