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Combination of Polarized TIRF and ATR Spectroscopies for Determination of the Second and Fourth Order Parameters of Molecular Orientation in Thin Films and Construction of an Orientation Distribution Based on the Maximum Entropy Method

Combination of Polarized TIRF and ATR Spectroscopies for Determination of the Second and Fourth Order Parameters of Molecular Orientation in Thin Films and Construction of an Orientation Distribution Based on the Maximum Entropy Method

Runge, Anne F.; Saavedra, S. Scott; Mendes, Sergio B.

期刊名称The Journal of Physical Chemistry B
作者Runge, Anne F.; Saavedra, S. Scott; Mendes, Sergio B.
卷第110卷
期第13期
印刷ISSN1520-6106
电子ISSN1520-5207
文件大小181.03KB
发表时间2006-04
DOI10.1021/jp056048m
页码6721-6731

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