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Thermalelectro-feedback model for multi-emitter finger power heterojunction bipolar transistor Part II: current crush phenomenon

Thermalelectro-feedback model for multi-emitter finger power heterojunction bipolar transistor Part II: current crush phenomenon

Yarn, K. F.; Wang, Y. H.; Houng, M. P.; Lew, B. K.

期刊名称International Journal of Electronics
作者Yarn, K. F.; Wang, Y. H.; Houng, M. P.; Lew, B. K.
卷第93卷
期第9期
印刷ISSN0020-7217
电子ISSN1362-3060
文件大小365.55KB
发表时间2006-09
DOI10.1080/08827510410001694941
页码581-588

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