ESD design automation & methodology to prevent CDM failures in 130 & 90 nm ASIC design systems
- 作者Ciaran J. Brennan; Joseph Kozhaya; Robert Proctor; Jeffrey Sloan; Shunhua Chang; James Sundquist; Terry Lowe; David Picozzi
- 卷第64卷
- 期第2期
- 印刷ISSN0304-3886
- 文件大小615.09KB
- 发表时间2006
- DOI10.1016/j.elstat.2005.04.003
- 页码112-127
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