[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Diffractive lenses for high resolution laser based failure analysis

• 作者Zachariasse, Frank; Goossens, Martijn
• 文件大小1870.53KB
• 发表时间2006
• DOI10.1109/ipfa.2006.251006
• 页码95-96