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[IEEE 2006 International Semiconductor Conference - Sinaia, Romania (2006.09.27-2006.09.29)] 2006 International Semiconductor Conference - Characterization of Ba0.5Sr0.5TiO3 Thin Films For Tuneable Devices

[IEEE 2006 International Semiconductor Conference - Sinaia, Romania (2006.09.27-2006.09.29)] 2006 International Semiconductor Conference - Characterization of Ba0.5Sr0.5TiO3 Thin Films For Tuneable Devices

Ioachim, A.; Toacsan, M.; Banciu, M.; Nedelcu, L.; Dutu, C.; Sava, F.; Popescu, M.; Scarisoreanu, N.; Dinescu, M.
  • 作者Ioachim, A.; Toacsan, M.; Banciu, M.; Nedelcu, L.; Dutu, C.; Sava, F.; Popescu, M.; Scarisoreanu, N.; Dinescu, M.
  • 文件大小4241.64KB
  • 发表时间2006
  • DOI10.1109/smicnd.2006.283995
  • 页码271-274
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