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[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Lead frame Hillock-Induced Silicon Crack

[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Lead frame Hillock-Induced Silicon Crack

Flores, R.C.; Fabia, M.G.; Nabong, M.T.; Soria, A.O.; Gabunas, C.B.

作者Flores, R.C.; Fabia, M.G.; Nabong, M.T.; Soria, A.O.; Gabunas, C.B.
文件大小2974.89KB
发表时间2006
DOI10.1109/ipfa.2006.251040
页码248-251

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