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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Testing of Precision DACs Using Low-Resolution ADCs with Dithering

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Testing of Precision DACs Using Low-Resolution ADCs with Dithering

Jin, Le; Haggag, Hosam; Geiger, Randall; Chen, Degang

作者Jin, Le; Haggag, Hosam; Geiger, Randall; Chen, Degang
文件大小425.51KB
发表时间2006
DOI10.1109/test.2006.297628
页码1-10

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