[IEEE 2006 Bipolar/BiCMOS Circuits and Technology Meeting - Maastricht, Netherlands (2006.10.8-2006.10.10)] 2006 Bipolar/BiCMOS Circuits and Technology Meeting - Ruggedness Improvement by Protection
Bezooijen, Andre; Graauw, Anton; Ruijs, Lennart; Pramm, Skule; Chanlo, Christophe; Ten Dolle, Henk; Straten, Freek; Mahmoudi, Reza; Van Roermund, Arthur
- 作者Bezooijen, Andre; Graauw, Anton; Ruijs, Lennart; Pramm, Skule; Chanlo, Christophe; Ten Dolle, Henk; Straten, Freek; Mahmoudi, Reza; Van Roermund, Arthur
- 文件大小517.25KB
- 发表时间2006
- DOI10.1109/bipol.2006.311174
- 页码1-4