Electronic circuit reliability modeling

Joseph B. Bernstein; Moshe Gurfinkel; Xiaojun Li; Jörg Walters; Yoram Shapira; Michael Talmor

作者Joseph B. Bernstein; Moshe Gurfinkel; Xiaojun Li; Jörg Walters; Yoram Shapira; Michael Talmor
卷第46卷
期第12期
印刷ISSN0026-2714
文件大小535.26KB
发表时间2006
DOI10.1016/j.microrel.2005.12.004
页码1957-1979

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