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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Linearity Test of Analog-to-Digital Converters Using Kalman Filtering

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Linearity Test of Analog-to-Digital Converters Using Kalman Filtering

Jin, Le; Chen, Degang; Geiger, Randall

作者Jin, Le; Chen, Degang; Geiger, Randall
文件大小786.27KB
发表时间2006
DOI10.1109/test.2006.297679
页码1-9

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