[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - The Effects of Proton Irradiation on 90 nm Strained Si CMOS on SOI Devices
- 作者Appaswamy, Aravind; Jun, Bongim; Diestelhorst, Ryan; Espinel, Gustavo; Prakash, A.P.; Cressler, John; Marshall, Paul; Marshall, Cheryl; Liang, Qingqing; Freeman, Greg; Isaacs-Smith, Tamara; Williams, John
- 文件大小3860.65KB
- 发表时间2006
- DOI10.1109/REDW.2006.295469
- 页码62-65
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