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[IEEE 2006 25th International Conference on Microelectronics - Belgrade, Serbia and Montenegro (14-17 May 2006)] 2006 25th International Conference on Microelectronics - Infulence of small emitter and contact non-uniformities on the current filamentation in 3.3-kV p+ - n- -n+ silicon diodes

[IEEE 2006 25th International Conference on Microelectronics - Belgrade, Serbia and Montenegro (14-17 May 2006)] 2006 25th International Conference on Microelectronics - Infulence of small emitter and contact non-uniformities on the current filamentation in 3.3-kV p+ - n- -n+ silicon diodes

Felsl, H.P.; Falck, E.; Niedernostheide, F.-J.; Lutz, J.

作者Felsl, H.P.; Falck, E.; Niedernostheide, F.-J.; Lutz, J.
文件大小3005.88KB
发表时间2006
DOI10.1109/icmel.2006.1650923
页码174-178

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