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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Embedded Memory Diagnosis: An Industrial Workflow

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Embedded Memory Diagnosis: An Industrial Workflow

Appello, Davide; Tancorre, Vincenzo; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; Reorda, Matteo
  • 作者Appello, Davide; Tancorre, Vincenzo; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; Reorda, Matteo
  • 文件大小365.17KB
  • 发表时间2006
  • DOI10.1109/test.2006.297672
  • 页码1-9
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