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[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Defect-Oriented and Time-Constrained Wafer-Level Test-Length Selection for Core-Based Digital SoCs

Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu

作者Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu
文件大小932.10KB
发表时间2006
DOI10.1109/test.2006.297646
页码1-10

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