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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - System Identification Approach Applied to Jitter Estimation

[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - System Identification Approach Applied to Jitter Estimation

Verbeyst, Frans; Rolain, Yves; Schoukens, Johan; Pintelon, Rik

作者Verbeyst, Frans; Rolain, Yves; Schoukens, Johan; Pintelon, Rik
文件大小1239.95KB
发表时间2006
DOI10.1109/imtc.2006.328226
页码1752-1757

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