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[IEEE 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Prague, Czech Republic (April 18-21, 2006)] 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - A Leakage-Based Random Bit Generator with On-line Fault Detection

[IEEE 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Prague, Czech Republic (April 18-21, 2006)] 2006 IEEE Design and Diagnostics of Electronic Circuits and systems - A Leakage-Based Random Bit Generator with On-line Fault Detection

Bucci, M.; Luzzi, R.
  • 作者Bucci, M.; Luzzi, R.
  • 文件大小117.82KB
  • 发表时间2006
  • DOI10.1109/ddecs.2006.1649623
  • 页码232-233
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