Fracture Toughness with Thermal Aging in CF8M/SA508 Welds
Woo, Seung Wan; Kwon, Jae Do; Choi, Young Hwan
- 期刊名称Key Engineering Materials
- 作者Woo, Seung Wan; Kwon, Jae Do; Choi, Young Hwan
- 电子ISSN1662-9795
- 文件大小2968.78KB
- 发表时间2006
- DOI10.4028/www.scientific.net/kem.321-323.570
- 页码570-573