[ACM Press the 2006 IEEE/ACM international conference - San Jose, California (2006.11.05-2006.11.09)] Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design - ICCAD '06 - Soft error reduction in combinational logic using gate resizing and flipflop selection
Rao, Rajeev R.; Blaauw, David; Sylvester, Dennis
- 作者Rao, Rajeev R.; Blaauw, David; Sylvester, Dennis
- 文件大小381.47KB
- 发表时间2006
- DOI10.1145/1233501.1233603