[AIP BEAM INSTRUMENTATION WORKSHOP 2006: Twelfth Beam Instrumentation Workshop - Batavia, Illinois (USA) (1-4 May 2006)] AIP Conference Proceedings - Transverse Phase Space Reconstruction and Emittance Measurement of Intense Electron Beams using a Tomography Technique

Stratakis, D.; Kishek, R. A.; Li, H.; Bernal, S.; Walter, M.; Tobin, J.; Quinn, B.; Reiser, M.; O’Shea, P. G.

作者Stratakis, D.; Kishek, R. A.; Li, H.; Bernal, S.; Walter, M.; Tobin, J.; Quinn, B.; Reiser, M.; O’Shea, P. G.
卷第868卷
文件大小836.03KB
发表时间2006
DOI10.1063/1.2401440
页码497-507

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