Temperature dependences of an In0.46Ga0.54As/In0.42Al0.58As based metamorphic high electron mobility transistor (MHEMT)
C. Chen; P. Lai; W. Lour; D. Guo; J. Tsai; W. Liu
- 作者C. Chen; P. Lai; W. Lour; D. Guo; J. Tsai; W. Liu
- 文件大小397.75KB
- 发表时间2006
- DOI10.1088/0268-1242/21/9/024