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Temperature dependences of an In0.46Ga0.54As/In0.42Al0.58As based metamorphic high electron mobility transistor (MHEMT)

Temperature dependences of an In0.46Ga0.54As/In0.42Al0.58As based metamorphic high electron mobility transistor (MHEMT)

C. Chen; P. Lai; W. Lour; D. Guo; J. Tsai; W. Liu
  • 作者C. Chen; P. Lai; W. Lour; D. Guo; J. Tsai; W. Liu
  • 文件大小397.75KB
  • 发表时间2006
  • DOI10.1088/0268-1242/21/9/024
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