[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Efficient Temperature - Dependent Symbolic Sensitivity Analysis and Symbolic Performance Evaluation in Analog Circuit Synthesis

• 作者Huiying Yang, ; Vemuri, R.
• 文件大小54.87KB
• 发表时间2006
• DOI10.1109/date.2006.244139
• 页码1-2