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[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Enabling Fine-Grain Leakage Management by Voltage Anchor Insertion

[IEEE 2006 Design, Automation and Test in Europe - Munich, Germany (2006.3.6-2006.3.10)] Proceedings of the Design Automation & Test in Europe Conference - Enabling Fine-Grain Leakage Management by Voltage Anchor Insertion

Babighian, P.; Benini, L.; Macii, A.; Macii, E.

作者Babighian, P.; Benini, L.; Macii, A.; Macii, E.
文件大小485.70KB
发表时间2006
DOI10.1109/date.2006.243770
页码1-6

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