[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy (24-26 May 2006)] 2006 IEEE International Conference on IC Design and Technology - A Fast and Accurate Monte Carlo Method for Interconnect Variation
Zhang, M.; Olbrich, M.; Kinzelbach, H.; Seider, D.; Barke, E.
作者Zhang, M.; Olbrich, M.; Kinzelbach, H.; Seider, D.; Barke, E.