Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors

• 作者Andrzej Dziedzic; Andrzej Kolek; Waleed Ehrhardt; Heiko Thust
• 卷第46卷
• 印刷ISSN0026-2714
• 文件大小290.31KB
• 发表时间2006
• DOI10.1016/j.microrel.2004.12.014
• 页码352-359