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Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $mu$m CMOS SRAM

Warren, Kevin M.; Weller, Robert A.; Sierawski, Brian D.; Reed, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Porter, Mark E.; Wilkinson, Jeffrey D.; LaBel, Kenneth A.

作者Warren, Kevin M.; Weller, Robert A.; Sierawski, Brian D.; Reed, Robert A.; Mendenhall, Marcus H.; Schrimpf, Ronald D.; Massengill, Lloyd W.; Porter, Mark E.; Wilkinson, Jeffrey D.; LaBel, Kenneth A.
卷第54卷
期第4期
印刷ISSN0018-9499
电子ISSN1558-1578
文件大小435.57KB
发表时间2007
DOI10.1109/tns.2006.889810
页码898-903

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Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $mu$m CMOS SRAM