Computing the Soft Error Rate of a Combinational Logic Circuit Using Parameterized Descriptors
- 作者Rajeev R. Rao; Kaviraj Chopra; David T. Blaauw; Dennis M. Sylvester
- 卷第26卷
- 期第3期
- 印刷ISSN0278-0070
- 电子ISSN1937-4151
- 文件大小603.78KB
- 发表时间2007
- DOI10.1109/tcad.2007.891036
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