Signature Testing of Analog and RF Circuits: Algorithms and Methodology
Voorakaranam, R.; Akbay, S. S.; Bhattacharya, S.; Cherubal, S.; Chatterjee, A.
- 作者Voorakaranam, R.; Akbay, S. S.; Bhattacharya, S.; Cherubal, S.; Chatterjee, A.
- 卷第54卷
- 期第5期
- 印刷ISSN1549-8328
- 文件大小1611.46KB
- 发表时间2007
- DOI10.1109/tcsi.2007.895531