[ECS 212th ECS Meeting - Washington, DC (October 7 - October 12, 2007)] ECS Transactions - Nano-Scale Profile of the Dielectric Constant Near the Si/oxide Interface: A First-Principles Approach

• 作者Nakamura, Jun; Wakui, Sadakazu; Eguchi, Shunsuke; Yanai, Ryosuke; Natori, Akiko
• 卷第11卷
• 文件大小530.12KB
• 发表时间2007
• DOI10.1149/1.2778375
• 页码173-182