[IEEE Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Windsor, UK (2007.09.10-2007.09.14)] Testing: Academic and Industrial Conference Practice and Research Techniques - MUTATION (TAICPART-MUTATION 2007) - Mutation Analysis for Security Tests Qualification

• 作者Mouelhi, Tejeddine; Le Traon, Yves; Baudry, Benoit
• 文件大小501.81KB
• 发表时间2007
• DOI10.1109/TAIC.PART.2007.21
• 页码233-242