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Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

Precise Alignment of Single Nanowires and Fabrication of Nanoelectromechanical Switch and Other Test Structures

Li, Qiliang; Koo, Sang-Mo; Richter, Curt A.; Edelstein, Monica D.; Bonevich, John E.; Kopanski, Joseph J.; Suehle, John S.; Vogel, Eric M.
  • 期刊名称IEEE Transactions On Nanotechnology
  • 作者Li, Qiliang; Koo, Sang-Mo; Richter, Curt A.; Edelstein, Monica D.; Bonevich, John E.; Kopanski, Joseph J.; Suehle, John S.; Vogel, Eric M.
  • 卷第6卷
  • 期第2期
  • 印刷ISSN1536-125X
  • 文件大小1584.84KB
  • 发表时间2007-03
  • DOI10.1109/TNANO.2007.891827
  • 页码256-262
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