[IEEE 2007 International Workshop on Physics of Semiconductor Devices - Mumbai, India (2007.12.16-2007.12.20)] 2007 International Workshop on Physics of Semiconductor Devices - Quality assessment of CdZnTe (Zn ∼ 4 %) crystals
- 作者Kulkarni, Gururaj A.; Koteswara Rao, K. S. R.; Raman, R.; Pandey, Akhilesh; Sharma, R. K.; Garg, A. K.; Srivastava, Meenakshi
- 文件大小192.17KB
- 发表时间2007
- DOI10.1109/IWPSD.2007.4472547
- 页码453-455
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