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[IEEE 2007 IEEE International Conference on Electro/Information Technology - Chicago, IL, USA (2007.05.17-2007.05.20)] 2007 IEEE International Conference on Electro/Information Technology - Inductance aware performance and reliability analysis of high performance integrated circuits

[IEEE 2007 IEEE International Conference on Electro/Information Technology - Chicago, IL, USA (2007.05.17-2007.05.20)] 2007 IEEE International Conference on Electro/Information Technology - Inductance aware performance and reliability analysis of high performance integrated circuits

Abinash Roy, ; Jingye Xu, ; Chowdhury, Masud H.
  • 作者Abinash Roy, ; Jingye Xu, ; Chowdhury, Masud H.
  • 文件大小606.35KB
  • 发表时间2007
  • DOI10.1109/EIT.2007.4374478
  • 页码91-95
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