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Effects of the channel thickness on the structural and electrical characteristics of room-temperature fabricated ZnO thin-film transistors

Effects of the channel thickness on the structural and electrical characteristics of room-temperature fabricated ZnO thin-film transistors

Oh, Byeong-Yun; Jeong, Min-Chang; Ham, Moon-Ho; Myoung, Jae-Min
  • 期刊名称Semiconductor Science and Technology
  • 作者Oh, Byeong-Yun; Jeong, Min-Chang; Ham, Moon-Ho; Myoung, Jae-Min
  • 卷第22卷
  • 期第6期
  • 印刷ISSN0268-1242
  • 电子ISSN1361-6641
  • 文件大小375.34KB
  • 发表时间2007-06-01
  • DOI10.1088/0268-1242/22/6/004
  • 页码608-612
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