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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - SiP-test: Predicting delivery quality

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - SiP-test: Predicting delivery quality

Biewenga, Alex; de Jong, Frans
  • 作者Biewenga, Alex; de Jong, Frans
  • 文件大小313.45KB
  • 发表时间2007
  • DOI10.1109/TEST.2007.4437652
  • 页码1-10
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