[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - SiP-test: Predicting delivery quality
Biewenga, Alex; de Jong, Frans
- 作者Biewenga, Alex; de Jong, Frans
- 文件大小313.45KB
- 发表时间2007
- DOI10.1109/TEST.2007.4437652
- 页码1-10