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[IEEE 2007 International Symposium on Industrial Embedded Systems - Costa da Caparica, Portugal (2007.07.4-2007.07.6)] 2007 International Symposium on Industrial Embedded Systems - Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems

[IEEE 2007 International Symposium on Industrial Embedded Systems - Costa da Caparica, Portugal (2007.07.4-2007.07.6)] 2007 International Symposium on Industrial Embedded Systems - Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems

Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund
  • 作者Jervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund
  • 文件大小4321.09KB
  • 发表时间2007
  • DOI10.1109/sies.2007.4297319
  • 页码71-77
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