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[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - New Hot-Carrier Lifetime Technique for High- to Low-Supplied Voltage nMOSFETs

[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - New Hot-Carrier Lifetime Technique for High- to Low-Supplied Voltage nMOSFETs

Guerin, C.; Parthasarathy, C.; Huard, V.; Bravaix, A.
  • 作者Guerin, C.; Parthasarathy, C.; Huard, V.; Bravaix, A.
  • 文件大小3668.17KB
  • 发表时间2007
  • DOI10.1109/ipfa.2007.4378079
  • 页码173-179
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