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[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Automotive IC's: less testing, more prevention

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Automotive IC's: less testing, more prevention

Appello, Davide
  • 作者Appello, Davide
  • 文件大小836.49KB
  • 发表时间2007
  • DOI10.1109/test.2007.4437699
  • 页码1-2
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