[IEEE 2007 International Symposium on Integrated Circuits - Singapore (2007.09.26-2007.09.28)] 2007 International Symposium on Integrated Circuits - Yield Predictive Model Characterization In Analog Circuit Design
- 作者Ali, Sawal Hamid Md; Wilson, Peter R.; Brown, Andrew D.
- 文件大小2897.92KB
- 发表时间2007
- DOI10.1109/isicir.2007.4441855
- 页码289-292
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