[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - An Investigation of External Latchup
- 作者Farbiz, Farzan; Rosenbaum, Elyse
- 文件大小2369.44KB
- 发表时间2007
- DOI10.1109/relphy.2007.369970
- 页码600-601
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