[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - SRAM Yield Sensitivity to Supply Voltage Fluctuations and Its Implications on Vmin
- 作者Kanj, Rouwaida; Joshi, Rajiv; Nassif, Sani
- 文件大小2858.30KB
- 发表时间2007
- DOI10.1109/icicdt.2007.4299588
- 页码1-4
同作者推荐
[IEEE IEEE International Symposium on Communications and Information Technology, 2005. ISCIT 2005. - Beijing, China (Oct. 12-14, 2005)] IEEE International Symposium on Communications and Information Technology, 2005. ISCIT 2005. - A hyperlink-based algorithm incorporating hops between web pagesLai, J.; Soh, B. · 2005
[IEEE IEEE International Conference on e-Business Engineering (ICEBE'05) - Beijing, China (2005.10.12-2005.10.18)] IEEE International Conference on e-Business Engineering (ICEBE'05) - CRANAI: a new search model reinforced by combining a ranking algorithm with author inputsLai, J.; Soh, B. · 2005