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Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy

Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy

Cobley, R. J.; Teng, K. S.; Brown, M. R.; Wilks, S. P.; Rees, P.

期刊名称Applied Physics Letters
作者Cobley, R. J.; Teng, K. S.; Brown, M. R.; Wilks, S. P.; Rees, P.
卷第91卷
期第8期
印刷ISSN0003-6951
文件大小631.61KB
发表时间2007
DOI10.1063/1.2775049

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