[IEEE 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Bangalore, India (2007.01.6-2007.01.10)] 20th International Conference on VLSI Design held jointly with 6th International Conference on Embedded Systems (VLSID'07) - Constant Function Independent Test Set for Fault Detection in Bit Parallel Multipliers in GF(2^m)
Rahaman, H.; Mathew, J.; Pradhan, D.
- 作者Rahaman, H.; Mathew, J.; Pradhan, D.
- 文件大小308.34KB
- 发表时间2007
- DOI10.1109/vlsid.2007.53
- 页码479-484