[IEEE 2007 IEEE Autotestcon - Baltimore, MD, USA (2007.09.17-2007.09.20)] 2007 IEEE Autotestcon - ATML capabilities explained
Gorringe, Chris; Lopes, Teresa; Pleasant, Dan
- 作者Gorringe, Chris; Lopes, Teresa; Pleasant, Dan
- 文件大小418.76KB
- 发表时间2007
- DOI10.1109/autest.2007.4374218
- 页码178-189