[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Delay fault simulation with bounded gate delay mode
- 作者Bose, Soumitra; Grimes, Hillary; Agrawal, Vishwani D.
- 文件大小371.48KB
- 发表时间2007
- DOI10.1109/test.2007.4437637
- 页码1-10
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