Device Architecture
Tao, Guoqiao; Chauveau, Helene; Nath, Som; Dormans, Do; Verhaar, Rob
- 期刊名称IEEE Transactions on Device and Materials Reliability
- 作者Tao, Guoqiao; Chauveau, Helene; Nath, Som; Dormans, Do; Verhaar, Rob
- 卷第7卷
- 期第2期
- 印刷ISSN1530-4388
- 文件大小845.48KB
- 发表时间2007-06
- DOI10.1109/tdmr.2007.901411
- 页码304-309