[IEEE 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - Crystal City, VA, USA (2007.09.27-2007.09.29)] 2007 First IEEE International Conference on Biometrics: Theory, Applications, and Systems - A new probabilistic Iris Quality Measure for comprehensive noise detection

• 作者Krichen, Emine; Garcia-Salicetti, Sonia; Dorizzi, Bernadette
• 文件大小2590.46KB
• 发表时间2007
• DOI10.1109/btas.2007.4401906
• 页码1-6